A Study of Device and Reliability Measurements in the 0.25μm Split Gate Flash Memory
碩士 === 國立聯合大學 === 電子工程學系碩士班 === 94 === The needful characteristics of a flash memory are small volume, high speed and high capacity. In the future, how to get the good working efficiency in the high capacity is a very important topic. In this thesis, under varying the length between floating gate an...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54339177142656867686 |