The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
碩士 === 國立聯合大學 === 化學工程學系碩士班 === 94 === This research of uses inductively coupled plasma spectroscopy (ICP) to measure the composition of the film. Scanning electron microscope (SEM ) assesses the thickness of the plating and deposition speed. X-ray diffraction (XRD ) analyzes crystalline or amorphou...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30966132149168403881 |