The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy

碩士 === 國立聯合大學 === 化學工程學系碩士班 === 94 === This research of uses inductively coupled plasma spectroscopy (ICP) to measure the composition of the film. Scanning electron microscope (SEM ) assesses the thickness of the plating and deposition speed. X-ray diffraction (XRD ) analyzes crystalline or amorphou...

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Main Authors: Ming -we Lin, 林明偉
Other Authors: none
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/30966132149168403881
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spelling ndltd-TW-094NUUM50630022015-10-13T16:41:04Z http://ndltd.ncl.edu.tw/handle/30966132149168403881 The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy 化學鍍沈積鎳鉬磷三元合金之研究 Ming -we Lin 林明偉 碩士 國立聯合大學 化學工程學系碩士班 94 This research of uses inductively coupled plasma spectroscopy (ICP) to measure the composition of the film. Scanning electron microscope (SEM ) assesses the thickness of the plating and deposition speed. X-ray diffraction (XRD ) analyzes crystalline or amorphous structures. Auger electron spectroscopy (AES) checks copper diffusion. ICP controls plating composition and explains XRD analyses. XRD result explains copper diffusion. This study makes clear component relationship of electroless bath, such as NiSO4、NaH2PO2 、Na2MoO4 and complex agents. This result of plating under control is better. After heat treatment , the result finds plating of molybdenum to increases heat stability。Phosphorous increases to keep amorphous easily。In Ni-Mo-P electroless plating, phosphorou content is very important to copper diffusion barrier 。In the future the field of copper diffusion barrier may have chance to improve。This research of copper diffusion barrier to Ni-Mo-P electroless has no significant effect because film is very thin。 none 朱錦明 2006 學位論文 ; thesis 90 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立聯合大學 === 化學工程學系碩士班 === 94 === This research of uses inductively coupled plasma spectroscopy (ICP) to measure the composition of the film. Scanning electron microscope (SEM ) assesses the thickness of the plating and deposition speed. X-ray diffraction (XRD ) analyzes crystalline or amorphous structures. Auger electron spectroscopy (AES) checks copper diffusion. ICP controls plating composition and explains XRD analyses. XRD result explains copper diffusion. This study makes clear component relationship of electroless bath, such as NiSO4、NaH2PO2 、Na2MoO4 and complex agents. This result of plating under control is better. After heat treatment , the result finds plating of molybdenum to increases heat stability。Phosphorous increases to keep amorphous easily。In Ni-Mo-P electroless plating, phosphorou content is very important to copper diffusion barrier 。In the future the field of copper diffusion barrier may have chance to improve。This research of copper diffusion barrier to Ni-Mo-P electroless has no significant effect because film is very thin。
author2 none
author_facet none
Ming -we Lin
林明偉
author Ming -we Lin
林明偉
spellingShingle Ming -we Lin
林明偉
The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
author_sort Ming -we Lin
title The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
title_short The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
title_full The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
title_fullStr The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
title_full_unstemmed The Study of Electroless Deposition of Ni-Mo-P Ternary Alloy
title_sort study of electroless deposition of ni-mo-p ternary alloy
publishDate 2006
url http://ndltd.ncl.edu.tw/handle/30966132149168403881
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