Microscale Heat Transfer Characteristics in Thin Films

碩士 === 國立臺灣科技大學 === 機械工程系 === 94 === Heat conduction in multi-layer thin films is a critical issue in the design of electronic devices and packages. Normally a thermal resistance offered to heat conduction by a uniform layer of a film is directly proportional to its thickness. When two materials hav...

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Main Authors: Huei-Jen Lai, 賴慧蓁
Other Authors: 洪俊卿
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/ufu4u5
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spelling ndltd-TW-094NTUS54891602019-05-15T19:18:15Z http://ndltd.ncl.edu.tw/handle/ufu4u5 Microscale Heat Transfer Characteristics in Thin Films 微觀多層薄膜之傳導熱傳特性研究 Huei-Jen Lai 賴慧蓁 碩士 國立臺灣科技大學 機械工程系 94 Heat conduction in multi-layer thin films is a critical issue in the design of electronic devices and packages. Normally a thermal resistance offered to heat conduction by a uniform layer of a film is directly proportional to its thickness. When two materials having different thermal conductivities are in mechanical contact, an additional contact thermal resistance occurs between the two layers since perfect contact at the interface occurs only at a limited number of spots and the void found elsewhere between the layers is filled with air. It is possible that the intrinsic thermal resistance of a thin film is significant smaller than the contact resistance at the interface. In the present study, the effect of the contact resistance on the transient heat conduction characteristic of a multi-layer thin film system is first investigated. The multi-layer thin film system severs as a model for a thin film thermal detector. It is found that the contact resistance between thin film layers can change the temperature response characteristics of the thermal detector. For a constant heat flux input, the temperature response between the active junction layer and reference junction layer increases due to contact resistance. To better understand the roughness effect on the thermal contact resistance, a simple geometric configuration is proposed to model the roughness region, and the effect of various geometric scales of the roughness region on the contact resistance is studied using a finite element program and a thermal network model. The calculated thermal resistance values from both methods show similar trends, but the one-dimensional thermal network model always gives overpredicted values due to its neglectance of the two- dimensional conduction effect. The effect of applying thermal grease in the roughness region on the thermal resistance is also studied. 洪俊卿 2006 學位論文 ; thesis 98 zh-TW
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language zh-TW
format Others
sources NDLTD
description 碩士 === 國立臺灣科技大學 === 機械工程系 === 94 === Heat conduction in multi-layer thin films is a critical issue in the design of electronic devices and packages. Normally a thermal resistance offered to heat conduction by a uniform layer of a film is directly proportional to its thickness. When two materials having different thermal conductivities are in mechanical contact, an additional contact thermal resistance occurs between the two layers since perfect contact at the interface occurs only at a limited number of spots and the void found elsewhere between the layers is filled with air. It is possible that the intrinsic thermal resistance of a thin film is significant smaller than the contact resistance at the interface. In the present study, the effect of the contact resistance on the transient heat conduction characteristic of a multi-layer thin film system is first investigated. The multi-layer thin film system severs as a model for a thin film thermal detector. It is found that the contact resistance between thin film layers can change the temperature response characteristics of the thermal detector. For a constant heat flux input, the temperature response between the active junction layer and reference junction layer increases due to contact resistance. To better understand the roughness effect on the thermal contact resistance, a simple geometric configuration is proposed to model the roughness region, and the effect of various geometric scales of the roughness region on the contact resistance is studied using a finite element program and a thermal network model. The calculated thermal resistance values from both methods show similar trends, but the one-dimensional thermal network model always gives overpredicted values due to its neglectance of the two- dimensional conduction effect. The effect of applying thermal grease in the roughness region on the thermal resistance is also studied.
author2 洪俊卿
author_facet 洪俊卿
Huei-Jen Lai
賴慧蓁
author Huei-Jen Lai
賴慧蓁
spellingShingle Huei-Jen Lai
賴慧蓁
Microscale Heat Transfer Characteristics in Thin Films
author_sort Huei-Jen Lai
title Microscale Heat Transfer Characteristics in Thin Films
title_short Microscale Heat Transfer Characteristics in Thin Films
title_full Microscale Heat Transfer Characteristics in Thin Films
title_fullStr Microscale Heat Transfer Characteristics in Thin Films
title_full_unstemmed Microscale Heat Transfer Characteristics in Thin Films
title_sort microscale heat transfer characteristics in thin films
publishDate 2006
url http://ndltd.ncl.edu.tw/handle/ufu4u5
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