Development of Line Scan Optical Inspection Sysytem on pseudo-particle Size Analysis
碩士 === 國立臺灣科技大學 === 機械工程系 === 94 === The aim of this study is to develop a pseudo-particle size analysis instrument by optical line scan technology . The developed system composes of four major modules , which are materials feeding module , image acquired module , vision procession module and contro...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8bvn7w |