The stress corrosion of brass by contact model atomic force microscopy

• Main Authors: Jing-Sheng Chiang, 江景昇
• Other Authors: Chaur-Jeng Wang
• Format: Others
• Language: zh-TW
• Published: 2006
• Online Access: http://ndltd.ncl.edu.tw/handle/2w25xu

碩士 === 國立臺灣科技大學 === 機械工程系 === 94 === The atomic force microscopy (AFM) has been employed to investigate the in-situ corrosion phenomena of the brass immersed in 0.1 wt% CuCl2 aqueous solution. A field emission EPMA is also used to analyze the corrosion pits and corrosion products of brass. The crystalline phases of the corrosion products were examined by an X-ray diffractometer. It is found that the in-situ formation phenomena of corrosion pits and corrosion products on nano scale can be explored by the liquid mode AFM. The initial of stress corrosion reaction and corrosion kinetics of brass induced by the AFM tip in 0.1wt% CuCl2 aqueous solution are also investigated. It is found that the surface of commercial C26000 brass was attacked by the 0.1 wt% cuprous chloride aqueous solution observed by an in-situ AFM. Corrosion pits and Cu2O oxide particle are found on the alloy surface. The particle size and average surface roughness of the specimen increase with immersion time. The stress induced corrosion phenomena is observed when the AFM tip scans on the specimen surface.