Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis
碩士 === 國立臺灣大學 === 電子工程學研究所 === 94 === This thesis presents a scan chain diagnosis technique to locate seven types of single faults in scan chains, including two single stuck-at faults and five single timing faults. This technique implements the Jump Simulation, a novel parallel simulation technique...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/36473155452498023934 |