Studying the Effects of Different Types and Different Particles Sizes On Porous Silica Low-K Thin Films
碩士 === 國立臺灣大學 === 化學工程學研究所 === 94 === Mesoporous silica has been widely studied for low-k materials, because of it’s low dielectric constant (about 2), good thermal stability, and friendly-preparation procedures. However, the porosity in the film makes the mechanical strength insufficient. The impro...
Main Authors: | Yu-Chiao Liu, 柳佑樵 |
---|---|
Other Authors: | 萬本儒 |
Format: | Others |
Language: | zh-TW |
Published: |
2006
|
Online Access: | http://ndltd.ncl.edu.tw/handle/67918218444782079190 |
Similar Items
-
Effects of Preparation Processes on Low-k Porous Silica Thin Films
by: Chun-Wei Yu, et al.
Published: (2007) -
Improvement of Mechanical Strength of Porous Low-k Silica Thin Film
by: Cheng-Tsung Tsai, et al.
Published: (2004) -
Studying the effects of processes on crystalline porous low-k silica thin films
by: Chin-Lin Teng, et al.
Published: (2008) -
Preparation of Porous Silica Low-k Films by Using Different Concentration of Structure Directing Agent TPAOH
by: Chiung-Yun Chang, et al.
Published: (2013) -
Investigation on the Structure-Property Relationship of Nano-Clustering Silica (NCS) Porous Low-k Thin Films
by: Chuang, Shindy, et al.
Published: (2009)