Crystallization study of InxGa1-xN epitaxial layers on sapphire
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 94 === We have performed the polarization modulation near-field scanning optical microscopy (PM-NSOM) measurements to investigate the correlation between crystalline and optical properties of InGaN epilayers and crystalline quality of In-rich InGaN epilayers. The...
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| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61374378585469849038 |