The study of nanoimprint lithography with the novel UV-based mould
碩士 === 國立清華大學 === 電子工程研究所 === 94 === As progress of IC fabrication technology, the device size was scaling down gradually. According to the prediction of ITRS (International Technology Roadmap For Semiconductors Conference) of 2005, 1/2 Pitch of the component has reached 57nm in 2008, and will reach...
Main Authors: | Chen-Liang Liao, 廖振良 |
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Other Authors: | Fon-Shan Huang |
Format: | Others |
Language: | zh-TW |
Published: |
2006
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Online Access: | http://ndltd.ncl.edu.tw/handle/38183694510677551365 |
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