The study of nanoimprint lithography with the novel UV-based mould

碩士 === 國立清華大學 === 電子工程研究所 === 94 === As progress of IC fabrication technology, the device size was scaling down gradually. According to the prediction of ITRS (International Technology Roadmap For Semiconductors Conference) of 2005, 1/2 Pitch of the component has reached 57nm in 2008, and will reach...

Full description

Bibliographic Details
Main Authors: Chen-Liang Liao, 廖振良
Other Authors: Fon-Shan Huang
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/38183694510677551365

Similar Items