Concentration Measurement of Cd and Te in the Interface of CdTe/InSb Using Multiple-Wave X-Ray Diffraction

• Main Authors: Chiu-Mei Shueh, 薛秋美
• Other Authors: Shih-Lin Chang
• Format: Others
• Language: zh-TW
• Published: 2006
• Online Access: http://ndltd.ncl.edu.tw/handle/94868039010663161927

碩士 === 國立清華大學 === 物理學系 === 94 === The concentration of Cd and Te in the interface of CdTe/InSb is measured by X-ray three-beam diffraction (002/-3-11) under resonant conditions. Because of anomalous scattering effects, phase shift due to resonance becomes much more appreciable in affecting the diffraction intensity. In this study we choose different momentum transfer qr normal to the interface and measure phase shift for each qr around the resonant energy, i.e., the Cd L_{III} edge. Comparsion between the experiment data and the theoretical analysis for the crystallographic phases of the structure-factor triplet leads to successful determination of Cd concertation in the interface region.