Concentration Measurement of Cd and Te in the Interface of CdTe/InSb Using Multiple-Wave X-Ray Diffraction
碩士 === 國立清華大學 === 物理學系 === 94 === The concentration of Cd and Te in the interface of CdTe/InSb is measured by X-ray three-beam diffraction (002/-3-11) under resonant conditions. Because of anomalous scattering effects, phase shift due to resonance becomes much more appreciable in affecting the diffr...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/94868039010663161927 |