Reliability Analysis of the Cracked Ag-SU8 Interface on the Channel Wall in a Micro-PEMFC

• Main Authors: Yi-san Shih, 石益三
• Other Authors: Chi-Hui Chien
• Format: Others
• Language: en_US
• Published: 2006
• Online Access: http://ndltd.ncl.edu.tw/handle/46372187482025971569

碩士 === 國立中山大學 === 機械與機電工程學系研究所 === 94 === The efficiency of the fuel cell depends on both the kinetics of the electrochemical process and performance of the components. The main aim of this research is to analysis the reliability of the cracked Ag-SU8 interface on the channel wall in a micro-PEMFC. An existed surface crack on the channel wall subjected to the flow induced compressive stresses and shear stresses will propagate and lead to the spall formation. The results show that as the crack length increases, the value of KI will increase, but the value of KII decreases slightly. The reliability analysis of the interfacial crack between Ag and SU8 on the Micro-channel wall in PEMFC is discussed in this thesis.