Theoretical Analysis and Measurement for ESD Phenomenon

碩士 === 國立中山大學 === 電機工程學系研究所 === 94 === The trends of present design in electronic systems are towards high speed, small size, and lower voltage levels. The noise immunity of high speed digital circuit decreases. ESD problem becomes more and more important for electric products because of the triboel...

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Bibliographic Details
Main Authors: Po-Ching Lai, 賴柏青
Other Authors: Tzyy-Sheng Horng
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/96040789048522761061

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