Test Algorithms for CAMs with Neighborhood Pattern-Sensitive Faults
碩士 === 國立中央大學 === 電機工程研究所 === 94 === This thesis presents two algorithms for detecting neighborhood pattern-sensitive faults (NPSFs) for content addressable memories. The first part presents a test algorithm for binary content addressable memories (BCAMs) with NPSFs. Differ from previous works which...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/p26d63 |