A Study on the Process Technologies and Characteristics of Novel Tri-Gate FETs and TFTs

博士 === 國立交通大學 === 電子工程系所 === 94 === In this thesis, we studied the process technologies and device characteristics of novel SOI tri-gate FETs (TGFETs) and low-temperature poly-Si TFTs with NiSi films. Including thermal stability of NiSi films on different substrates, the control of lateral silicidat...

Full description

Bibliographic Details
Main Authors: Chia Pin Lin, 林家彬
Other Authors: Bing Yue Tsui
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/06045907922301898854

Similar Items