Front-side Copper Metallization Process for InAlAs/InGaAs Low Noise MHEMTs

碩士 === 國立交通大學 === 材料科學與工程系所 === 94 === In this dissertation, the feasibility of using Cu-metallized Schottky contact and interconnects for an InAlAs/InGaAs metamorphic high electron mobility transistors (MHEMTs) is studied. The front side Cu metallization process was performed to reduce the producti...

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Bibliographic Details
Main Authors: Chen, Po-CHou, 陳柏舟
Other Authors: Edward Y . Chang
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/42299396803959434122

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