Electrical characterization of the well-aligned ZnO nanorods by impedance spectroscopy
碩士 === 國立成功大學 === 化學工程學系碩博士班 === 94 === AC impedance analysis has been employed to investigate the carrier concertations of the well-aligned ZnO nanorods on p++-Si. Indium contacts were deposited on the ZnO nanorod surfaces and p++-Si backside to form the ohmic contacts. Elements, such as junction...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/60793810818834796337 |