Transition Fault ATPG Based on Stuck-At Fault Test Patterns

碩士 === 國立中興大學 === 資訊科學系所 === 94 ===

Bibliographic Details
Main Authors: Yan-Nan Lin, 林彥男
Other Authors: 王行健
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/90324228801467909462
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spelling ndltd-TW-094NCHU53940642016-05-25T04:14:53Z http://ndltd.ncl.edu.tw/handle/90324228801467909462 Transition Fault ATPG Based on Stuck-At Fault Test Patterns 基於定值錯誤測試樣本的轉態錯誤自動測試樣本產生器 Yan-Nan Lin 林彥男 碩士 國立中興大學 資訊科學系所 94 王行健 2006 學位論文 ; thesis 35 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中興大學 === 資訊科學系所 === 94 ===
author2 王行健
author_facet 王行健
Yan-Nan Lin
林彥男
author Yan-Nan Lin
林彥男
spellingShingle Yan-Nan Lin
林彥男
Transition Fault ATPG Based on Stuck-At Fault Test Patterns
author_sort Yan-Nan Lin
title Transition Fault ATPG Based on Stuck-At Fault Test Patterns
title_short Transition Fault ATPG Based on Stuck-At Fault Test Patterns
title_full Transition Fault ATPG Based on Stuck-At Fault Test Patterns
title_fullStr Transition Fault ATPG Based on Stuck-At Fault Test Patterns
title_full_unstemmed Transition Fault ATPG Based on Stuck-At Fault Test Patterns
title_sort transition fault atpg based on stuck-at fault test patterns
publishDate 2006
url http://ndltd.ncl.edu.tw/handle/90324228801467909462
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