Unwrapping phase maps with high noise and shear line by the Mininmum Lp-norm method and the submap-stitching method
碩士 === 國立中興大學 === 機械工程學系所 === 94 === Optical measurement technology has such advantages as the non-contact property, the accuracy of wave length scale, and immediate measuremnet. We need this type of technology to do the measurement in MEMS, such as Elestron Speckle Pattern Interferometry, it use ma...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/vpdrbe |
| Summary: | 碩士 === 國立中興大學 === 機械工程學系所 === 94 === Optical measurement technology has such advantages as the non-contact property, the accuracy of wave length scale, and immediate measuremnet. We need this type of technology to do the measurement in MEMS, such as Elestron Speckle Pattern Interferometry, it use mainly optical interferometer theory to get the fringe map, and apply the phase shifting technology to get wrapped phase map.Then use phase unwrapping further to get the original phase map and transform it into the physical quantity we want to know, such as displacement and deformation.
The present phase unwrapping technology has solve the problem that the fringe map has high miscellaneous signals.The problems we need to overcome are the wrapped map that has high miscellaneous signals and itself discontinuity phenomenon.(We generally name it as the Shear line.) The main approach to phase unwrapping technology in my paper is based on Minimum LP–norm.With submap-stitching theory , we can find out fork location of the discontinuos shape from the result of unwrapped phase map. Using the curve fitting to modify the wrong stitching submaps can make the phase to unwrap successfully.
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