Unwrapping phase maps with high noise and shear line by the Mininmum Lp-norm method and the submap-stitching method
碩士 === 國立中興大學 === 機械工程學系所 === 94 === Optical measurement technology has such advantages as the non-contact property, the accuracy of wave length scale, and immediate measuremnet. We need this type of technology to do the measurement in MEMS, such as Elestron Speckle Pattern Interferometry, it use ma...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/vpdrbe |