Automatic Inspection of MURA Defect in Color Filter

Automatic Inspection of MURA Defect in Color Filter

碩士 === 義守大學 === 工業工程與管理學系碩士班 === 94 === The global TFT-LCD (Thin Film Transistor-Liquid Crystal Display) market demand is continuous rising recently. Color filter (CF) is the most critical component in TFT-LCD since it directly defines the color image quality of the display. Besides, it is the most...

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Bibliographic Details
Main Authors:	Sih-hong Chen, 陳思宏
Other Authors:	Yu-min Chiang
Format:	Others
Language:	zh-TW
Published:	2006
Online Access:	http://ndltd.ncl.edu.tw/handle/61134491132481579466

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