A New Testing Method for LCM
碩士 === 逢甲大學 === 電子工程所 === 94 === A new system of Failure Analysis for TFT-LCD module is presented. This system is suitable to two package types (TCP and COF) of TFT-LCD source-driver and gate-driver. This system consists of high success rate (~95%) de-capsulate technique, new sockets between device...
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| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95014445623160654421 |
| Summary: | 碩士 === 逢甲大學 === 電子工程所 === 94 === A new system of Failure Analysis for TFT-LCD module is presented. This system is suitable to two package types (TCP and COF) of TFT-LCD source-driver and gate-driver. This system consists of high success rate (~95%) de-capsulate technique, new sockets between device and tester probe, and powerful inspection testing patterns. These new techniques are useful to other FA tools such as internal probing on tester. Besides, these new techniques are also presented which make TFT-LCD driver IC and Timing Controller analysis more effective. For TFT-LCD module analysis with this system, FA success rate is prompt and FA cycle time shorted successfully and effectively.
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