An Application of QFD and Taguchi Methods on STN-LCD Process Improvement
碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 94 === This research applies a framework which integrates the Quality Function Deployment (QFD) and Taguchi Methods (TM) to identify which parameters have significant influence on the process. The QFD is applied to transform the customer requirements into the proces...
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ndltd-TW-094FCU050310012015-10-13T10:34:09Z http://ndltd.ncl.edu.tw/handle/92904461111011120706 An Application of QFD and Taguchi Methods on STN-LCD Process Improvement 應用品質機能展開和田口品質工程於STN-LCD製程改善 Wan-Wen Yen 顏婉雯 碩士 逢甲大學 工業工程與系統管理學研究所 94 This research applies a framework which integrates the Quality Function Deployment (QFD) and Taguchi Methods (TM) to identify which parameters have significant influence on the process. The QFD is applied to transform the customer requirements into the process technical characteristics. The optimum parameters of the critical process is then obtained by applying Taguchi Methods. The optimal spacer spray process parameters are determined based on the balance between the nominal-the-best (NTB) quality characteristic and the smaller-the-better (STB) quality characteristic. Experiment results show that, the capability of accuracy is improved from stage D to stage A, and the process capability index is improved from 0.033 to 1.104 by using the suggested process parameters. Jeng-Fung Chen 陳正芳 2006 學位論文 ; thesis 56 zh-TW |
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碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 94 === This research applies a framework which integrates the Quality Function Deployment (QFD) and Taguchi Methods (TM) to identify which parameters have significant influence on the process. The QFD is applied to transform the customer requirements into the process technical characteristics. The optimum parameters of the critical process is then obtained by applying Taguchi Methods.
The optimal spacer spray process parameters are determined based on the balance between the nominal-the-best (NTB) quality characteristic and the smaller-the-better (STB) quality characteristic.
Experiment results show that, the capability of accuracy is improved from stage D to stage A, and the process capability index is improved from 0.033 to 1.104 by using the suggested process parameters.
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author2 |
Jeng-Fung Chen |
author_facet |
Jeng-Fung Chen Wan-Wen Yen 顏婉雯 |
author |
Wan-Wen Yen 顏婉雯 |
spellingShingle |
Wan-Wen Yen 顏婉雯 An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
author_sort |
Wan-Wen Yen |
title |
An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
title_short |
An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
title_full |
An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
title_fullStr |
An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
title_full_unstemmed |
An Application of QFD and Taguchi Methods on STN-LCD Process Improvement |
title_sort |
application of qfd and taguchi methods on stn-lcd process improvement |
publishDate |
2006 |
url |
http://ndltd.ncl.edu.tw/handle/92904461111011120706 |
work_keys_str_mv |
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