Virtual Metrology Technique for Semiconductor Manufacturing
碩士 === 中原大學 === 機械工程研究所 === 94 === Abstract The semiconductor of our country regards manufacturing as the subject. Under global keen competition, strict process control already become the indispensable demand. It is most important factor of international competitiveness for Panel factory and Liquid...
Main Authors: | Tin-Wei Shen, 沈庭偉 |
---|---|
Other Authors: | yao-ren zhang |
Format: | Others |
Language: | zh-TW |
Published: |
2006
|
Online Access: | http://ndltd.ncl.edu.tw/handle/31435490116798171493 |
Similar Items
-
Development of virtual metrology in semiconductor manufacturing
by: Gill, Bhalinder Singh
Published: (2011) -
Applying Virtual Metrology System for Fault Detection in Semiconductor Manufacturing Process
by: LIN, ZONG-YI, et al.
Published: (2017) -
Virtual Metrology Technique for Chemical Mechanical Polishing Manufacturing
by: Chia-Xian Yi, et al.
Published: (2007) -
A Realizable Overlay Virtual Metrology System in Semiconductor Manufacturing: Proposal, Challenges and Future Perspective
by: Tze Chiang Tin, et al.
Published: (2021-01-01) -
A virtual metrology approach for maintenance compensation to improve yield in semiconductor manufacturing
by: Kuo-Yi Lin, et al.
Published: (2014-07-01)