An independent component analysis based filter design for defect detection in Backlight Panels and TFT-LCD Array Panels
碩士 === 元智大學 === 工業工程與管理學系 === 93 === In this study, a filter-design scheme based on Independent Component Analysis (ICA) is proposed for defect inspection in backlight and TFT-LCD (Thin film transistor liquid crystal display) panels. In a backlight panel, the sensed image is uniform. The gray levels...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/26170816700694299797 |