| Summary: | 碩士 === 國立臺灣科技大學 === 工業管理系 === 93 === The purpose of this research is about implementation of the SPC concept to fine tune the semi-conductor test operation for chasing the optimum Overall Equipment Efficiency, as well as Overall Equipment Utilization (OEU), then eventually achieve the state of art performance in both of cost & quality.
Parameters mainly considered in this paper include: Overall Equipment Efficiency (OEE), Lot acceptance %, Net Unit Built (NUB),Defect Piece Per Million (DPPM). The essential idea is to control variables like human being discipline, equipment hard ware,test program integrity prior to test to substitute the QA lot acceptance which is performed at right after 100% final test. Capacity consumed for L/A check as well as retest for securing the yiled are believed as the two of major resources of Non Value Added operations.
In this study, data are collected from the real operation informations. Real practices of Test SPC kick-off are demonstrated & assessed to show up the impact to OEE result.
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