A Study of Applying Test SPC to Promote Test Operation OEE and OEU
碩士 === 國立臺灣科技大學 === 工業管理系 === 93 === The purpose of this research is about implementation of the SPC concept to fine tune the semi-conductor test operation for chasing the optimum Overall Equipment Efficiency, as well as Overall Equipment Utilization (OEU), then eventually achieve the state of art...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30418963206820864402 |