| Summary: | 碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 93 === We use a tapping-mode tuning-fork force-sensing short-fiber-probe near-field scanning optical microscopy (TMTF-NSOM) to study near-field surface photovoltage (NFSPV), near-field photoluminescence (NFPL) spectrum and near-field electroluminescence (NFEL) spectrum at the surface or edge of semiconductor electro-optical samples. Different exciting modes, wavelengths, optical powers and locations are carried out in experiments. The corresponding intensity, structure and spatial variation of NFSPV signals or intensity distributions of NFPL and NFEL are investigated. Results of the experiments clearly demonstrate the usefulness of NFSPV, NFPL and NFEL and the potential of their applications on nano-photonics.
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