Flash Memory Testing Using a Sample Classification Method
碩士 === 國立清華大學 === 電機工程學系 === 93 === As the semiconductor process keeps scaling down and IC designs get bigger and faster, uncertainty is becoming one of the greatest challenges for the semiconductor industry. Unexpected and unpredictable behavior of devices often leads to poor quality and reliabilit...
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| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/84656840176317006183 |