Probing the build-in electric field and modulating field on semiconductor microstructure by photoreflectance
碩士 === 國立中山大學 === 光電工程研究所 === 93 === Abstract In this thesis, We have probed the semiconductor microstructure by photoreflectance. A laser beam was used to modulate the dielectric constant and the parameter ΔR and R were probed with a white light source. First, we perform measurement and simulation...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/60677668209634750470 |