The Development of an Automatic Desktop Phase-Shifting Shadow Moire System
碩士 === 國立屏東科技大學 === 機械工程系 === 93 === One of the main factors makes the warpage of the BGA electronic packages is the difference of thermal expansion coefficient between materials. A laser point-to-point measuring method is primary used to measure the warpage now by off-line sampling inspection. Neve...
Main Authors: | Shih-Hsien Wu, 吳時賢 |
---|---|
Other Authors: | Yi-Hong Lin |
Format: | Others |
Language: | zh-TW |
Published: |
2005
|
Online Access: | http://ndltd.ncl.edu.tw/handle/88242747420796797909 |
Similar Items
-
Use of Automatic Phase-Shifting Shadow Moire System to Measure the Shape of Wafer
by: Cheng-Chuang Chia, et al.
Published: (2003) -
INVESTIGATION OF THE SURFACE BEHAVIOR OF ELECTRONIC PACKAGINGS BY PHASE-SHIFTING SHADOW MOIRĔ AND DIGITAL PROJECTION MOIRĔ METHODS
by: HUANG, WEI-ZHAN, et al.
Published: (2003) -
MEASUREMENT OF SURFACE TOPOGRAPHY OF TRANSPARENT MATERIALS BY DIGITAL PHASE-SHIFTING SHADOW MOIRE METHOD
by: Kang, Wen Yi, et al.
Published: (2014) -
Use of Phase-Shifting Shadow Moire Method to Measure the Deformation of Wafer at Elevated Temperature
by: Zhong-Hao Zheng, et al.
Published: (2002) -
Investigation of Warpage of Electronic Packagings After Machining by Phase-Shifting Shadow Moire Method
by: LIU, YU-WEN, et al.
Published: (2001)