Path-Oriented Cross-Talk Induced Delay Testing

碩士 === 國立東華大學 === 電機工程學系 === 93 === Because of increasing gate density and interconnects, the influence of coupling effects (cross-talk) on the recent integrated circuits are more and more seriously. Therefore, how to correctly and quickly evaluate the cross-talk effects in a circuit often represent...

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Bibliographic Details
Main Authors: Kuei-Yung Chang, 張貴勇
Other Authors: Chun-Lung Hsu
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/88058007003710522898