Studies of V-defects on GaN Films by Micro Raman Spectroscopy
碩士 === 國立交通大學 === 電子物理系所 === 93 === The optical properties of V-defects on GaN films were characterized by using atomic force microscopy and micro-Raman spectroscopy. Raman LO related modes of 3.3�慆 V-defects show noticeable blue shifts from different doping concentration samples. For V-defects of d...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/64490779060912276336 |