Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress

碩士 === 國立交通大學 === 電子工程系所 === 93 ===

Bibliographic Details
Main Author:	江可玉
Other Authors:	鄭晃忠
Format:	Others
Language:	en_US
Published:	2005
Online Access:	http://ndltd.ncl.edu.tw/handle/54233479250313614160

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spelling	ndltd-TW-093NCTU54281132016-06-06T04:10:50Z http://ndltd.ncl.edu.tw/handle/54233479250313614160 Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress 低溫複晶矽薄膜電晶體在閘極交流訊號下之可靠度研究江可玉碩士國立交通大學電子工程系所 93 鄭晃忠 2005 學位論文 ; thesis 73 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立交通大學 === 電子工程系所 === 93 ===
author2	鄭晃忠
author_facet	鄭晃忠江可玉
author	江可玉
spellingShingle	江可玉 Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
author_sort	江可玉
title	Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
title_short	Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
title_full	Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
title_fullStr	Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
title_full_unstemmed	Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress
title_sort	study on the reliability of low-temperature polycrystallinesilicon thin film transistors under ac gate bias stress
publishDate	2005
url	http://ndltd.ncl.edu.tw/handle/54233479250313614160
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Study on the Reliability of Low-Temperature PolycrystallineSilicon Thin Film Transistors under AC Gate Bias Stress

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