Times Series Visualization of Patents

碩士 === 國立交通大學 === 資訊科學系所 === 93 === With the coming of economic-based knowledge, we pay much attention to intellectual property (IP) content and the amount of patent documents increases quickly. Patent documents are the repository of how technology advances and, more importantly, show how language s...

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Bibliographic Details
Main Authors: Chiung Wan,Wang, 王瓊婉
Other Authors: Wei-Pang Yang
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/18205769772386321600
Description
Summary:碩士 === 國立交通大學 === 資訊科學系所 === 93 === With the coming of economic-based knowledge, we pay much attention to intellectual property (IP) content and the amount of patent documents increases quickly. Patent documents are the repository of how technology advances and, more importantly, show how language supports the change.[2] However, increasing patent documents makes the reading complicate and requires advanced information technology to assist the investigation of patents. In this paper, we propose a patent trend analysis system, which combines text mining and statistic test methods. We want to show the technology trend in a specific field. In the patent trend analysis system, firstly, we make definitions about concepts and apply text mining to extract important concepts from patents. Second, we use statistic test to check whether the retrieved concepts are significant in a specific time interval. Finally, we visualize the analysis result.