Applying Data Mining Techniques to Product Abnormal Detection for Semiconductor Package Manufacture

碩士 === 義守大學 === 資訊管理學系碩士班 === 93 === The semiconductor package manufacture enterpriser is always caring about the questions of new process yielding good result while in the course of production. Because the yield will be concerned the quality of products and the profitability. It must invest huge...

Full description

Bibliographic Details
Main Authors: Che-kun Shih, 史哲坤
Other Authors: leorean
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/65692185167163250676

Similar Items