Applying Data Mining Techniques to Product Abnormal Detection for Semiconductor Package Manufacture
碩士 === 義守大學 === 資訊管理學系碩士班 === 93 === The semiconductor package manufacture enterpriser is always caring about the questions of new process yielding good result while in the course of production. Because the yield will be concerned the quality of products and the profitability. It must invest huge...
Main Authors: | Che-kun Shih, 史哲坤 |
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Other Authors: | leorean |
Format: | Others |
Language: | zh-TW |
Published: |
2005
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Online Access: | http://ndltd.ncl.edu.tw/handle/65692185167163250676 |
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