A Study On Accelerated Life Testing for the MTTF of Wireless LAN Card

• Main Authors: Ming-Cheng Chu, 朱明澂
• Other Authors: Jhy-Ping Jhang
• Format: Others
• Language: zh-TW
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/94618356698597701293

碩士 === 華梵大學 === 工業管理學系碩士班 === 93 === It’s gradual to shorten production duration of new products had been required. Therefore it must draft a plan to understand lifetime of product and the tendency of reliability versus time. Accelerated life test can be reached the purpose within the reasonable time. The request of international buyer beginning to quality is in the assurance of the wireless network product mean lifetime to failure (MTTF). We chose the Universal Serial Bus (USB) wireless local area network card (WLANC) as target to study the accelerated life testing process. First, WLANC are individually predicted by using American commercial standard Telcordia coordinated with software RELEX. The goal of reliability prediction is to estimate the MTTF of the product fast. The MTTF prediction uses the combining laboratory data with part count method to get the life is 36817.286750 hours. Secondly, We apply the different environment stress (example for temperature, humidity, random vibration, temperature altitude pressure, ..., and so on) before to explored the environment testing, and to find the cause-effect relationship of failure phenomena. Next step been operation at accelerated life tested conditions at three-temperatures (T1=65℃, T2=75℃ and T3=85℃), suitable life-stress relationship and models and the accelerated life testing will be conducted. Finally, we will collect and analysis failure data use graphical method is also applied to elevate the relationship of the product life versus various extreme stresses. At the same time the classify and level range of extreme stresses are also be explored within the process of the study in order to find the suitable life distribution and an activation energy and MTTF under normal environment. The extrapolated MTTF at a normal operating temperature 25℃ is 34247.55029 hours with an activation energy of 0.6923 eV. Our results of this research will be helpful to reduce the life test time of USB WLANC products, and the results will be the important references for the industries to develop accelerated life testing in the future.