DROP TEST AND STRUCTURAL ANALYSIS OF CELL PHONES

• Main Authors: Hsin-Chang Lin, 林信昌
• Other Authors: none
• Format: Others
• Language: zh-TW
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/30021830444779793117

碩士 === 逢甲大學 === 機械工程學所 === 93 === ABSTRACT This study conducts the drop test of cell phones under the guidance of related test standards. To improve the anti-impact quality of cell phones, Taguchi method was employed for quality design. In addition, the finite element software, ANYSY/LS-DYNA, was used for the simulation. It is shown from the present investigation that: 1. The probability of separation of the outer shell from a cell phone is the largest when the cell phone drops down to the ground with its top or bottom facing up experimentally. And, the probability of damage of the inner LCD Module of a cell phone is the largest when the cell phone drops down to the ground with its front or back facing up. 2. The probability of damage of the inner LCD Module of a cell phone can be effectively improved by using the Taguchi method. The good rate of the inner LCD Module can then be increased from 70 % to 90%. 3. The impact phenomenon of the drop test of a cell phone can be reasonably simulated by ANSYS/LS-DYNA. The largest von Mises stress for a cell phone dropping down to the ground with its front or back facing up is larger than all the others, especially obviously observed on the nodes located at the glass plate. In addition, the maximum von Mises stress and the maximum principal stress was shown almost at the middle point by the sides of the glass plate experimentally and computationally. And, these are the most possible places where damage occurs when a cell phone drops down to the ground