Process capability Analysis forMulti-Characteristics Product：A Case Study of STN-LCD Front End Process

• Main Authors: Ching-Cheng Huang, 黃慶成
• Other Authors: Ching-Ju Feng
• Format: Others
• Language: zh-TW
• Published: 2005
• Online Access: http://ndltd.ncl.edu.tw/handle/77221759949995203505

碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 93 === Process capability indices, such as Cp, Cpk, ,Cpm and Cpmk, have been widely used in the manufacturing industry. It provides performance measures on process precision and process accuracy. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively rare. This paper quotes a overall capability index proposed by Chen et al. (2003). We establish a relationship between the Multi-Characteristic Process Capability Analysis Control Chart (MCPCA) and the confidence interval, and analyze .Finally, application an example in thin-film transistor liquid-crystal display process in Taiwan. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously.