The Study of Parameters Filtering in Wafer Acceptance Test
碩士 === 中華大學 === 資訊管理學系 === 93 === The complicated manufacturing process and high quality demand are two features of Very Large Scale Integration (VLSI). To monitor the whole manufacturing process and explore the reason of low yield, WAT plays an important role. But too many parameters of Wafer Accep...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/86843667473129099777 |