A Driver Design for High Lifespan Electric Vehicle

碩士 === 國立中正大學 === 機械系 === 93 === Abstract In the research, we first fabricate an open-loop driver for electric vehicle with the dynamic test platform to find the reason why electric vehicle lifespan is short. Second, we propose a closed-loop driver structure. While developing it, we also need...

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Bibliographic Details
Main Authors: Ming Feng Chou, 周明峰
Other Authors: Boe Shong Hong
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/59228036188117580202
Description
Summary:碩士 === 國立中正大學 === 機械系 === 93 === Abstract In the research, we first fabricate an open-loop driver for electric vehicle with the dynamic test platform to find the reason why electric vehicle lifespan is short. Second, we propose a closed-loop driver structure. While developing it, we also need the dynamic test platform to not only help the controller design but also test the closed-loop driver. The dynamic test platform is constructed by engineering dynamic inverse engineering. Finally, we compare the open-loop with the closed-loop driver in the dynamic test platform, and it proves the closed-loop can improve the electric vehicle lifespan.