The acceleration life test statistics principle analysis and the life forecast - the liquid-crystal display module crosstalk phenomenon as an example

• Main Authors: Pei-Hsi Lee, 李佩熹
• Other Authors: Yung-Chung Chen
• Format: Others
• Language: zh-TW
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/23065351447453969078

碩士 === 樹德科技大學 === 經營管理研究所 === 92 === Reliability test is an important method to the guarantee of quality. Life Testing can help us verify the reliability of a product. LCD manufactories play an important role in economic development in Taiwan. Taiwanese manufactories use the methods of Life test are based on Japanese technologies, however, most of them don’t know detail about the theories based on. From the motivation mentioned above, we hope our research could help LCD manufactories for the life and reliability estimate of LCD module. In this research, Accelerated Life Tests for LCD modules were conducted with different environment stresses (temperature and humidity). After failure analysis, we found all test samples failed with the same failure mode of Crosstalk. This result could also be confirmed by the failure data analysis. By the principle of statistic, the LCD modules failed with a Weibull distribution of same parameters. Finally, we develop relationship between life and stress through Arrhenius model and Temperature-Humidity model. This could help LCD manufactories for the life and reliability estimate of LCD module.