Nonlinear properties of optoelectronic semiconductors and nano-thin film studied by Z-scan measurement
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 92 === Abstract In this thesis, we study nonlinear optical properties of optoelectronic ZnO and Au nanometer thin films with different thickness under different laser powers by z-scan in which we use a pulsed laser (wavelength=532 nm, pulse width=0.71 ns, repetition...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61404634328075546690 |
| Summary: | 碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 92 === Abstract
In this thesis, we study nonlinear optical properties of optoelectronic ZnO and Au nanometer thin films with different thickness under different laser powers by z-scan in which we use a pulsed laser (wavelength=532 nm, pulse width=0.71 ns, repetition rate=15.29 KHz) as the light Source. In addition, we fit experimental data of Au thin film of different thickness to get nonlinear absorption/refraction coefficients β/γ. Interestingly, we add a measurement device in our experimental setup to detect reflective optical signal of Au/ZnO thin films with different thickness.
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