The Shift of IC Testing away from Mass Production and towards the Professional Services

• Main Authors: Wan-Cheng Chen, 陳萬成
• Other Authors: Bou-Wen Lin
• Format: Others
• Language: zh-TW
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/g55qd2

碩士 === 國立清華大學 === 高階主管經營管理碩士在職專班 === 92 === In the past decades IC testing industries provide testing mass production services for IC front-end, design and wafer manufacturing, which creates market pull in the early stage of Taiwan IC industries. Short delivery cycle time, low cost testing operation and turnkey solution of assembly and testing services is major competitive advantages. Since IC technology development, IC design is more and more complicate. The outstanding model of vertical integration in Taiwan is going to be changed. IC designer cannot only dedicate on design issue; test engineers cannot seek mass production of economic scale either. During the IC development trend, new products face heavy pressure of time-to-market, cost and quality; IC design group and test group have to work more closely. The thesis concludes IC testing will shift away from black-box services of mass production and towards knowledge-intensive professional services. Three major domains are in the study; •Explore IC designer’s expectation for IC test group. •Explore interaction models between IC designer and IC test group. •Explore the shift of IC testing away from mass production and towards professional services.