Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering

碩士 === 國立清華大學 === 工程與系統科學系 === 92 === Nanocrystalline TiN thin films were successfully deposited on Si (100) and D2 steel substrates using unbalanced magnetron sputtering (UBMS) system. The objective of this study was to investigate the effect of film thickness and Ti interlayer thickness on the com...

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Bibliographic Details
Main Authors: Fan-Yi Ou Yang, 歐陽汎怡
Other Authors: Jia-Hong Huang
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/36607902561557804174

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