Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering
碩士 === 國立清華大學 === 工程與系統科學系 === 92 === Nanocrystalline TiN thin films were successfully deposited on Si (100) and D2 steel substrates using unbalanced magnetron sputtering (UBMS) system. The objective of this study was to investigate the effect of film thickness and Ti interlayer thickness on the com...
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ndltd-TW-092NTHU55930112015-10-13T13:08:04Z http://ndltd.ncl.edu.tw/handle/36607902561557804174 Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering 非平衡磁控濺鍍製程中鍍膜厚度和鈦介層厚度對奈米晶氮化鈦薄膜之結構與性質之影響研究 Fan-Yi Ou Yang 歐陽汎怡 碩士 國立清華大學 工程與系統科學系 92 Nanocrystalline TiN thin films were successfully deposited on Si (100) and D2 steel substrates using unbalanced magnetron sputtering (UBMS) system. The objective of this study was to investigate the effect of film thickness and Ti interlayer thickness on the composition, structures, mechanical properties, and corrosion resistance of TiN film. The results showed that (111) was the dominant preferred orientation in the TiN films. The effects of the film thickness were only slightly varied on the N/Ti ratio, roughness, and grain size. The packing factor was almost constant with film thickness and the thinnest specimen reached a quite high packing factor of 0.8. Nanoindentation data, ranging from 22~29 GPa, indicated that hardness of the films was not related to the film texture and film thickness. The residual stresses of all TiN films were compressive, and mostly decreased with increasing film thickness in TiN/D2 specimens. Interfacial shear stress induced from the residual stress was increased with film thickness, whereas the residual stress was not necessarily increased with film thickness. In the bi-layer TiN/Ti coating, there was a critical Ti interlayer thickness (120~150nm) to effectively reduce the thermal stress and residual stress in the TiN coating. The results of potentiodynamic polarization scan in both 5% NaCl and 0.5M H2SO4 + 0.05M KSCN solutions indicated that packing factor was more effective than film thickness to the corrosion resistance for the coating. Furthermore, increasing film thickness or adding a Ti interlayer could effectively protect the substrate from the corrosive medium, if the packing factor was sufficiently high. Jia-Hong Huang Ge-Ping Yu 黃嘉宏 喻冀平 2004 學位論文 ; thesis 101 en_US |
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碩士 === 國立清華大學 === 工程與系統科學系 === 92 === Nanocrystalline TiN thin films were successfully deposited on Si (100) and D2 steel substrates using unbalanced magnetron sputtering (UBMS) system. The objective of this study was to investigate the effect of film thickness and Ti interlayer thickness on the composition, structures, mechanical properties, and corrosion resistance of TiN film. The results showed that (111) was the dominant preferred orientation in the TiN films. The effects of the film thickness were only slightly varied on the N/Ti ratio, roughness, and grain size. The packing factor was almost constant with film thickness and the thinnest specimen reached a quite high packing factor of 0.8. Nanoindentation data, ranging from 22~29 GPa, indicated that hardness of the films was not related to the film texture and film thickness. The residual stresses of all TiN films were compressive, and mostly decreased with increasing film thickness in TiN/D2 specimens. Interfacial shear stress induced from the residual stress was increased with film thickness, whereas the residual stress was not necessarily increased with film thickness. In the bi-layer TiN/Ti coating, there was a critical Ti interlayer thickness (120~150nm) to effectively reduce the thermal stress and residual stress in the TiN coating. The results of potentiodynamic polarization scan in both 5% NaCl and 0.5M H2SO4 + 0.05M KSCN solutions indicated that packing factor was more effective than film thickness to the corrosion resistance for the coating. Furthermore, increasing film thickness or adding a Ti interlayer could effectively protect the substrate from the corrosive medium, if the packing factor was sufficiently high.
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author2 |
Jia-Hong Huang |
author_facet |
Jia-Hong Huang Fan-Yi Ou Yang 歐陽汎怡 |
author |
Fan-Yi Ou Yang 歐陽汎怡 |
spellingShingle |
Fan-Yi Ou Yang 歐陽汎怡 Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
author_sort |
Fan-Yi Ou Yang |
title |
Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
title_short |
Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
title_full |
Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
title_fullStr |
Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
title_full_unstemmed |
Effect of film thickness and Ti interlayer thickness on the structure and properties of nanocrystalline TiN thin film deposited by unbalanced magnetron (UBM) sputtering |
title_sort |
effect of film thickness and ti interlayer thickness on the structure and properties of nanocrystalline tin thin film deposited by unbalanced magnetron (ubm) sputtering |
publishDate |
2004 |
url |
http://ndltd.ncl.edu.tw/handle/36607902561557804174 |
work_keys_str_mv |
AT fanyiouyang effectoffilmthicknessandtiinterlayerthicknessonthestructureandpropertiesofnanocrystallinetinthinfilmdepositedbyunbalancedmagnetronubmsputtering AT ōuyángfànyí effectoffilmthicknessandtiinterlayerthicknessonthestructureandpropertiesofnanocrystallinetinthinfilmdepositedbyunbalancedmagnetronubmsputtering AT fanyiouyang fēipínghéngcíkòngjiàndùzhìchéngzhōngdùmóhòudùhétàijiècénghòudùduìnàimǐjīngdànhuàtàibáomózhījiégòuyǔxìngzhìzhīyǐngxiǎngyánjiū AT ōuyángfànyí fēipínghéngcíkòngjiàndùzhìchéngzhōngdùmóhòudùhétàijiècénghòudùduìnàimǐjīngdànhuàtàibáomózhījiégòuyǔxìngzhìzhīyǐngxiǎngyánjiū |
_version_ |
1717732228584177664 |