A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier

A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier

碩士 === 國立清華大學 === 電機工程學系 === 92 === A Static Random Access Memory (SRAM) measurement unit is presented to sample the voltage signals of bit line pairs and to amplify the weak signal to higher voltage differential level. According to the measured result, the reliability analysis can be easily comple...

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Main Authors: Yi-Ming Sheng, 盛以明
Other Authors: Tsin-Yuan Chang
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/27964862236796017556
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spelling ndltd-TW-092NTHU54420372015-10-13T13:08:03Z http://ndltd.ncl.edu.tw/handle/27964862236796017556 A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier 一種靜態隨機存取記憶體之感應放大器輸入訊號分析量測單元 Yi-Ming Sheng 盛以明 碩士 國立清華大學 電機工程學系 92 A Static Random Access Memory (SRAM) measurement unit is presented to sample the voltage signals of bit line pairs and to amplify the weak signal to higher voltage differential level. According to the measured result, the reliability analysis can be easily completed through curve fitting process. The proposed circuit is designed and simulated with a 1K-bit SRAM by using the UMC 0.18μm 1P6M CMOS process. The analyzed result can provide designers to verify/strengthen their memory circuit design. Tsin-Yuan Chang 張慶元 2004 學位論文 ; thesis 47 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立清華大學 === 電機工程學系 === 92 === A Static Random Access Memory (SRAM) measurement unit is presented to sample the voltage signals of bit line pairs and to amplify the weak signal to higher voltage differential level. According to the measured result, the reliability analysis can be easily completed through curve fitting process. The proposed circuit is designed and simulated with a 1K-bit SRAM by using the UMC 0.18μm 1P6M CMOS process. The analyzed result can provide designers to verify/strengthen their memory circuit design.
author2 Tsin-Yuan Chang
author_facet Tsin-Yuan Chang
Yi-Ming Sheng
盛以明
author Yi-Ming Sheng
盛以明
spellingShingle Yi-Ming Sheng
盛以明
A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
author_sort Yi-Ming Sheng
title A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
title_short A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
title_full A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
title_fullStr A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
title_full_unstemmed A Measurement Unit for Input Signal Analysis of SRAM’s Sense Amplifier
title_sort measurement unit for input signal analysis of sram’s sense amplifier
publishDate 2004
url http://ndltd.ncl.edu.tw/handle/27964862236796017556
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