Diagnosing Deep SubMicron Defects For Path Delay Fault
碩士 === 國立清華大學 === 電機工程學系 === 92 === The goal of diagnosis method is to determine the suspected faulty node which is the most probable cause of the observed failures. An efficient diagnosis tool can drastically reduce the redesign time by providing the designers with a small set of possible faults to...
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/34429888348216443270 |
| Summary: | 碩士 === 國立清華大學 === 電機工程學系 === 92 === The goal of diagnosis method is to determine the suspected faulty node which is the most probable
cause of the observed failures. An efficient diagnosis tool can drastically reduce the redesign time
by providing the designers with a small set of possible faults to investigate. In this thesis, we have
proposed a method of delay fault diagnosis. We apply a testing methodology [1] to have two times
for every path. These two times, form a lower and upper bound respectively on the delay of path.
We translate the path bound to linear programming equations [2]. We can solve the equations and
use the result for diagnosing delay defect. Then, we simplify the linear programming equation
in advance to improve diagnosis. The experimental result shows the accuracy of our diagnosis
methodology.
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