Diagnosing Deep SubMicron Defects For Path Delay Fault
碩士 === 國立清華大學 === 電機工程學系 === 92 === The goal of diagnosis method is to determine the suspected faulty node which is the most probable cause of the observed failures. An efficient diagnosis tool can drastically reduce the redesign time by providing the designers with a small set of possible faults to...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/34429888348216443270 |